作者
Jan Ilavsky, Fan Zhang, Ross N Andrews, Ivan Kuzmenko, Pete R Jemian, Lyle E Levine, Andrew J Allen
发表日期
2018/6/1
期刊
Journal of applied crystallography
卷号
51
期号
3
页码范围
867-882
出版商
International Union of Crystallography
简介
Following many years of evolutionary development, first at the National Synchrotron Light Source, Brookhaven National Laboratory, and then at the Advanced Photon Source (APS), Argonne National Laboratory, the APS ultra-small-angle X-ray scattering (USAXS) facility has been transformed by several new developments. These comprise a conversion to higher-order crystal optics and higher X-ray energies as the standard operating mode, rapid fly scan measurements also as a standard operational mode, automated contiguous pinhole small-angle X-ray scattering (SAXS) measurements at intermediate scattering vectors, and associated rapid wide-angle X-ray scattering (WAXS) measurements for X-ray diffraction without disturbing the sample geometry. With each mode using the USAXS incident beam optics upstream of the sample, USAXS/SAXS/WAXS measurements can now be made within 5 min, allowing …
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