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Identification of apple stem-ends and calyxes from defects on process grading lines is a challenging task due to the complexity of the process. An in-line detection of the apple defect is developed in this article. Firstly, a computer controlled system using three color cameras is placed on the line. In this system, the apples placed on rollers are rotating while moving, and each camera is capturing three images from each apple. In total nine images are obtained for each apple allowing the total surface to be scanned. Secondly, the apple image is segmented from the black background by multi-threshold methods. The defects, including the stem-ends and calyxes, called regions of interest (ROIs), are segmented and counted in each of the nine images. Thirdly, since a calyx and stem-end cannot appear at the same image, an apple is defective if any one of the nine images has two or more ROIs. There are no complex …