作者
Chi-Man Vong, Pak-Kin Wong, Weng-Fai Ip
发表日期
2012/6/5
期刊
IEEE transactions on industrial electronics
卷号
60
期号
8
页码范围
3372-3385
出版商
IEEE
简介
Simultaneous-fault diagnosis is a common problem in many applications and well-studied for time-independent patterns. However, most practical applications are of the type of time-dependent patterns. In our study of simultaneous-fault diagnosis for time-dependent patterns, two key issues are identified: 1) the features of the multiple single faults are mixed or combined into one pattern which makes accurate diagnosis difficult, 2) the acquisition of a large sample data set of simultaneous faults is costly because of high number of combinations of single faults, resulting in many possible classes of simultaneous-fault training patterns. Under the assumption that the time-frequency features of a simultaneous fault are similar to that of its constituent single faults, these issues can be effectively resolved using our proposed framework combining feature extraction, pairwise probabilistic multi-label classification, and decision …
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