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In this paper, an improved compact OTFT model extending previous models into the subthreshold regime is presented. Two parameter extraction techniques using genetic algorithms (queen-bee and crossing-mates) are considered in order to determine the values of the main model parameters. The model and parameter extraction procedures are applied to a set of experimental measures in OTFTs from Infineon. Agreement between experimental and modelled DC I-V characteristics is excellent with both extraction methods but crossing-mates algorithm is faster and its results are more independent of the initial conditions.