作者
S Delmas-Bendhia, F Caignet, E Sicard, M Roca
发表日期
1999/11
期刊
IEEE Transactions on Electromagnetic Compatibility
卷号
41
期号
4
页码范围
403-406
出版商
IEEE
简介
This paper presents a technique for precise crosstalk delay measurement based on on-chip sampling. Results obtained on a test chip fabricated in 0.7-/spl mu/m CMOS technology exhibit a 100% delay increase in a long coupled line configuration.
引用总数
学术搜索中的文章
S Delmas-Bendhia, F Caignet, E Sicard, M Roca - IEEE Transactions on Electromagnetic Compatibility, 1999