作者
T Nguyen Thanh, Cédric Robert, Weiming Guo, Antoine Létoublon, Charles Cornet, Georges Elias, Anne Ponchet, Tony Rohel, Nicolas Bertru, Andrea Balocchi, Olivier Durand, Jean-Sébastien Micha, Mathieu Perrin, Slimane Loualiche, Xavier Marie, Alain Le Corre
发表日期
2012/9/1
期刊
Journal of applied physics
卷号
112
期号
5
出版商
AIP Publishing
简介
We report a structural study of molecular beam epitaxy-grown lattice-matched GaP/Si (0 0 1) thin layers with an emphasis on the interfacial structural properties, and optical studies of GaAsP (N)/GaP (N) quantum wells coherently grown onto the GaP/Si pseudo substrates, through a complementary set of characterization tools. Room temperature photoluminescence at 780 nm from the (GaAsPN/GaPN) quantum wells grown onto a silicon substrate is reported. Despite this good property, the time-resolved photoluminescence measurements demonstrate a clear influence of non-radiative defects initiated at the GaP/Si interface. It is shown from simulations, how x-ray diffraction can be used efficiently for analysis of antiphase domains. Then, qualitative and quantitative analyses of antiphase domains, micro-twins, and stacking faults are reported using complementarity of the local transmission electron microscopy and the …
引用总数
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