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Learning from a limited number of labeled samples (pixels) remains a key challenge in the hyperspectral image (HSI) classification. To address this issue, we propose a deep metric learning-based feature embedding model, which can meet the tasks both for same- and cross-scene HSI classifications. In the first task, when only a few labeled samples are available, we employ ideas from metric learning based on deep embedding features and make a similarity learning between pairs of samples. In this case, the proposed model can learn well to compare whether two samples belong to the same class. In another task, when an HSI image (target scene) that needs to be classified is not labeled at all, the embedding model can learn from another similar HSI image (source scene) with sufficient labeled samples and then transfer to the target model by using an unsupervised domain adaptation technique, which not only …