作者
Asif Islam Khan, Debanjan Bhowmik, Pu Yu, Sung Joo Kim, Xiaoqing Pan, Ramamoorthy Ramesh, Sayeef Salahuddin
发表日期
2011/9/12
期刊
Applied Physics Letters
卷号
99
期号
11
出版商
AIP Publishing
简介
We report a proof-of-concept demonstration of negative capacitance effect in a nanoscale ferroelectric-dielectric heterostructure. In a bilayer of ferroelectric Pb (Zr 0.2 Ti 0.8) O 3 and dielectric SrTiO 3, the composite capacitance was observed to be larger than the constituent SrTiO 3 capacitance, indicating an effective negative capacitance of the constituent Pb (Zr 0.2 Ti 0.8) O 3 layer. Temperature is shown to be an effective tuning parameter for the ferroelectric negative capacitance and the degree of capacitance enhancement in the heterostructure. Landau’s mean field theory based calculations show qualitative agreement with observed effects. This work underpins the possibility that by replacing gate oxides by ferroelectrics in nanoscale transistors, the sub threshold slope can be lowered below the classical limit (60 mV/decade).
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