作者
EG Fu, Nan Li, A Misra, RG Hoagland, H Wang, X Zhang
发表日期
2008/10/15
期刊
Materials Science and Engineering: A
卷号
493
期号
1-2
页码范围
283-287
出版商
Elsevier
简介
We have investigated the microstructure and mechanical properties of sputter-deposited Cu/V and Al/Nb metallic multilayer systems in this study and compared their mechanical properties to Cu/Cr and Cu/Nb reported earlier. These multilayer films are all of fcc/bcc type, with Kurdjumov–Sachs orientation relationship: {111}fcc//{110}bcc; 〈110〉fcc//〈111〉bcc. In all cases, hardnesses of multilayers increase with decreasing layer thickness, and reach maxima at approximately 2–5nm layer thickness. The differences in their mechanical properties (the Hall–Petch slope and peak hardness) are interpreted in terms of their differences in shear moduli, heat of mixing, and characteristics of interfaces.
引用总数
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学术搜索中的文章
EG Fu, N Li, A Misra, RG Hoagland, H Wang, X Zhang - Materials Science and Engineering: A, 2008