作者
Shekhar Borkar, Tanay Karnik, Siva Narendra, Jim Tschanz, Ali Keshavarzi, Vivek De
发表日期
2003/6/2
图书
Proceedings of the 40th annual Design Automation Conference
页码范围
338-342
简介
Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltage and temperature variations; and their impact on circuit and microarchitecture. Possible solutions to reduce the impact of parameter variations and to achieve higher frequency bins are also presented.
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S Borkar, T Karnik, S Narendra, J Tschanz… - Proceedings of the 40th annual Design Automation …, 2003