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Voltage scaling is one of the most effective mechanisms to improve microprocessors' energy efficiency. However, processors cannot operate reliably below a minimum voltage, Vccmin, since hardware structures may fail. Cell failures in large memory arrays (e.g., caches) typically determine Vccmin for the whole processor. We observe that most cache lines exhibit zero or one failures at low voltages. However, a few lines, especially in large caches, exhibit multi-bit failures and increase Vccmin. Previous solutions either significantly reduce cache capacity to enable uniform error correction across all lines, or significantly increase latency and bandwidth overheads when amortizing the cost of error-correcting codes (ECC) over large lines.

In this paper, we propose a novel cache architecture that uses variable-strength error-correcting codes (VS-ECC). In the common case, lines with zero or one failures use a simple and …