作者
C Corbari, Olivier Deparis, BG Klappauf, PG Kazansky
发表日期
2003/1/23
期刊
Electronics Letters
卷号
39
期号
2
页码范围
1
出版商
The Institution of Engineering & Technology
简介
A simple and nondestructive technique for measuring the thickness of the nonlinear optical layer in thermally poled glass, providing a minimum measurable thickness of 4 μm and 1 μm resolution, is demonstrated. This technique is generally applicable to other nonlinear optical layers as well.
学术搜索中的文章
C Corbari, O Deparis, BG Klappauf, PG Kazansky - Electronics Letters, 2003