作者
HW Jang, SH Baek, D Ortiz, CM Folkman, RR Das, YH Chu, Paul Shafer, JX Zhang, S Choudhury, V Vaithyanathan, YB Chen, DA Felker, MD Biegalski, MS Rzchowski, XQ Pan, DG Schlom, LQ Chen, R Ramesh, CB Eom
发表日期
2008/9/4
期刊
Physical review letters
卷号
101
期号
10
页码范围
107602
出版商
American Physical Society
简介
Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial thin films shows a strong strain dependence, even larger than conventional (001)-oriented films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) with biaxial strain while the spontaneous polarization itself remains almost constant.
引用总数
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