作者
Inchae Park, Yujin Jeong, Byungun Yoon
发表日期
2017/5
期刊
Scientometrics
卷号
111
页码范围
665-691
出版商
Springer Netherlands
简介
Patent applicants and examiners do not always have the same point of view when conducting a prior-art search. Although several studies have suggested differences between citations by applicants and examiners, the data and range of empirical studies are too incomplete to generalize the characteristics of relationships between citation types and the value of a technology or invention. To overcome this limitation, it is crucial to compare citations by applicants and by examiners in depth, with diverse perspectives and data, to determine the value of patent information for technological innovation. Thus, this paper suggests that the differences in the composition of technical information and patent quality in patent-level investigations as well as the locus of the knowledge source and knowledge recentness in knowledge-level investigations according to patent citation type (by applicants and examiners) reflect …
引用总数
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