作者
Guangxi Hu, Shuyan Hu, Jianhua Feng, Ran Liu, Lingli Wang, Lirong Zheng
发表日期
2015/11/3
研讨会论文
2015 IEEE 11th International Conference on ASIC (ASICON)
页码范围
1-4
出版商
IEEE
简介
Analytical models for threshold voltage, and drain induced barrier lowering effect of the short-channel fin-shaped field-effect transistor (FinFET) are obtained. The analytical model results are verified against simulations, good agreements are observed. The explicit expression for threshold voltage makes the model suitable to be embedded in circuit simulation and design tools.
学术搜索中的文章
G Hu, S Hu, J Feng, R Liu, L Wang, L Zheng - 2015 IEEE 11th International Conference on ASIC …, 2015