作者
Guang-Xi Hu, Shu-Yan Hu, Pei-Cheng Li, Ran Liu, Ling-Li Wang, Xing Zhou
发表日期
2014/10/28
研讨会论文
2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
页码范围
1-3
出版商
IEEE
简介
The threshold voltage, V th , of a surrounding-gate (SG) Schottky-barrier (SB) metal-oxide-semiconductor field-effect transistor (MOSFET) is investigated. An analytical expression for surface potential is obtained by solving Poisson's equation. Based on the potential model, an analytical expression for V th is achieved, with quantum mechanical effects and SB lowering effect included. It is found that V th will be raised by quantum mechanical effects and lowered by SB lowering effect. It is also found that, the influence of channel length on V th is complicated; when the channel length is 20 nm, V th is the smallest.
学术搜索中的文章
GX Hu, SY Hu, PC Li, R Liu, LL Wang, X Zhou - 2014 12th IEEE International Conference on Solid …, 2014