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Simple theoretical models are proposed for the analytical and the numerical study of the exchange bias phenomenon in the layered systems with rough AFM/FM interface. It is shown that the qualitative type of the magnetization curves depend crucially on the variation of the roughness degree. We obtain that the magnetization curves are qualitatively of the same type in the cases of perfect and rough FM/AFM interfaces. The method which allow to identify the character of the interface (rough or perfect) is proposed.