作者
Russell A Chipman
发表日期
2003/11/6
研讨会论文
Novel Optical Systems Design and Optimization VI
卷号
5174
页码范围
43-50
出版商
SPIE
简介
Three new polarimeters are described which represent advances in polarization metrology capabilities. Two are at a new polarization laboratory started at the University of Arizona’s Optical Sciences Center, (1) a Fiber Optic Spectropolarimeter and (2) a High Speed Mueller Matrix Imaging Polarimeter. The third is a new visible Mueller Matrix Spectropolarimeter for optical component test from a startup company, Axometrics, which is useful for detailed characterization of optical components and thin films via spectra of diattenuation, retardance, and depolarization.
引用总数
学术搜索中的文章
RA Chipman - Novel Optical Systems Design and Optimization VI, 2003