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Spectroscopic ellipsometry is widely used to find the optical properties of thin film coatings with optically smooth surfaces. Theoretical modeling is developed within the Sellmeier model theory in order to analyze, understand and predict the optical behavior of a ZnO thin film. ZnO is a well-known semiconductor with possible applications in optoelectronics such as solar cells, light emitting diodes, liquid crystal displays, etc. This paper presents an analysis of the optical properties of ZnO thin films obtained by the Sellmeier method using transmission spectra. For this, the computer language MATLAB was employed to generate the transmission data, and the film was observed to exhibit 96 % transmittance in the 500- 1000 nm range, superior for the solar spectrum. These transmission data were used to calculate various optical parameters such as refractive index, extinction coefficient, and optical band gap, which were calculated using different formulas with respect to wavelength in the UV-visible region. It is found that the direct band gap transition is 3.23 eV, while the refractive index and extinction coefficient show variation up to 400 nm. This sort of research work will help us find the best thin film coating technology for designing optoelectronic devices. Simulation and comparison of the optical properties help to optimize the best material/property ratio for promising devices. The present investigation can provide an environment friendly and low-cost tool for optoelectronic and solar cell devices.