作者
Fahim Ur Rahman, Sung Kim, Naveen John, Roshan Kumar, Xi Li, Rajesh Pamula, Keith A Bowman, Visvesh S Sathe
发表日期
2018/6/18
研讨会论文
2018 IEEE Symposium on VLSI Circuits
页码范围
65-66
出版商
IEEE
简介
An all-digital switched-capacitor (SC) based clock frequency (Felk) and supply voltage (V dd) regulator unifies Fclk and Vdd generation into a single control loop to reduce the V dd margin for variations in a sub-threshold ARM Cortex M0 processor. This fully-integrated unified clock and power (Uni-CaP) architecture allows continuous Vdd scalability without a low-dropout (LDO) regulator. Measurements from a 65nm test chip demonstrate a 16% Vdd reduction (94% Vdd margin recovery) and a 3.2× increase in Fclk operating range.
引用总数
2018201920202021202219211
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