作者
Giovanni Vescio, Gemma Martin, Albert Crespo-Yepes, Sergi Claramunt, Daniel Alonso, Julian Lopez-Vidrier, Sonia Estrade, Marc Porti, Rosana Rodriguez, Francesca Peiro, Albert Cornet, Albert Cirera, Montserrat Nafria
发表日期
2019/6/10
期刊
ACS applied materials & interfaces
卷号
11
期号
26
页码范围
23659-23666
出版商
American Chemical Society
简介
Low-power, high-performance metal–insulator–metal (MIM) non-volatile resistive memories based on HfO2 high-k dielectric are fabricated using a drop-on-demand inkjet printing technique as a low-cost and eco-friendly method. The characteristics of resistive switching of Pt (bottom)/HfO2/Ag (top) stacks on Si/SiO2 substrates are investigated in order to study the bottom electrode’s interaction with the HfO2 dielectric layer and the resulting effects on resistive switching. The devices show low Set and Reset voltages, high ON/OFF current ratio, and relatively low switching current (∼1 μA), which are comparable to the characteristics of current commercial CMOS memories. In order to understand the resistive switching mechanism, direct structural observation is carried out by field-emission scanning electron microscopy (FE-SEM) and high-resolution transmission electron microscopy (HRTEM) on cross-sectioned …
引用总数
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