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Defective chips may cause huge losses (even disasters), and thus ensuring the reliability of chips is fundamentally important. To ensure the functional correctness of chips, adequate testing is essential on the chip design implementation (CDI), which is the software implementation of the chip under design in hardware description languages, before putting on fabrication. Over the years, while some techniques targeting CDI functional testing have been proposed, there are still a number of hard-to-cover functionality points due to huge input space and complex constraints among variables in a test input. We call the coverage of these points last-mile functional coverage.Here, we propose the first technique targeting the significant challenge of improving last-mile functional coverage in CDI functional testing, called LMT, which does not rely on domain knowledge and CDI internal information. LMT first identifies the …