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The chemical reduction of exfoliated graphene oxide (GO) has gained widespread acceptance as a scalable route for the preparation of chemically derived graphene albeit with remnant topological defects and residual functional groups that preclude realization of the conductance of single-layered graphene. Reduction of GO with hydrazine is substantially effective in restoring the π-conjugated framework of graphene and leads to about a five-to-six orders of magnitude decrease of sheet resistance, but has also been found to result in incidental nitrogen incorporation. Here, the authors use a combination of x-ray photoelectron spectroscopy (XPS) and C, O, and N K-edge near-edge x-ray absorption fine structure (NEXAFS) spectroscopy to examine the local geometric and electronic structure of the incorporated nitrogen species. Both NEXAFS and XPS data suggest substantial recovery of the sp 2-hybridized …