发明者
Imad H Elhajj, Daniel Asmar, Mahdi Saleh, Ghassan Oueidat
发表日期
2021/4/13
专利局
US
专利号
10976147
专利申请号
16243584
简介
Provided herein are systems, methods and apparatuses for a thickness measurement device based on a capacitive array.
学术搜索中的文章
IH Elhajj, D Asmar, M Saleh, G Oueidat - US Patent 10,976,147, 2021