作者
Mathieu De Lafontaine, Erwine Pargon, Camille Petit-Etienne, Guillaume Gay, Abdelatif Jaouad, Marie-Josée Gour, Maite Volatier, Simon Fafard, Vincent Aimez, Maxime Darnon
发表日期
2019/6/15
期刊
Solar Energy Materials and Solar Cells
卷号
195
页码范围
49-54
出版商
North-Holland
简介
In this paper, the impact of the plasma process for III-V/Ge heterostructure etching on both the morphology and the photovoltaic performance is investigated for the fabrication of multijunction solar cells with a through cell via contact architecture. Three different plasma chemistries (BCl 3/Cl 2, SiCl 4/Cl 2, and SiCl 4/H 2/Cl 2) have been studied in order to obtain anisotropic etching through the multijunction heterostructure without inducing photovoltaic performance loss. SiCl 4-based plasma chemistries have been found more suitable to achieve deep via hole etching (∼ 30 µm) without lateral etching. The study suggests that SiCl x passivation is more efficient to protect the sidewalls compared to BCl x. The addition of H 2 in SiCl 4/Cl 2 mixture appears to reinforce the sidewall passivation and thus to limit the lateral etching. III-V/Ge triple junction solar cells with standard grid line and busbar front and back contact have …
引用总数
2020202120222023202448751
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M De Lafontaine, E Pargon, C Petit-Etienne, G Gay… - Solar Energy Materials and Solar Cells, 2019