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G Attolini, EM Bachari, KK Bajaj, S Basu, G Baud, S Ben Amor, F Bignoli, HD Bist, YA Boikov, E Borsella, M Bosi, S Botti, JI Brand, P Brovetto, L Ceniga, F Chen, Y Cheng, L Chen, H Cho, IH Choi, KI Cho, YR Cho, SY Chun, T Claeson, L Costa, Z Crnjak-Orel, D Daoan, NN Dass, A Delmastro, L Depero, Y Dequan, X Dong, P Dubcek, H Elhouichet, D Erts, M Falconieri, C Ferrari, R Fornari, S Grandi, D Gu, V Gupta, YB Hahn, KS Hong, H Hu, MY Jung, H Kageshima, R Kalyanaraman, A Kan, SY Kang, TW Kang, N Karar, CK Kim, DH Kim, HM Kim, JH Kim, S Krishnan, BS Lee, JH Lee, JM Lee, JY Lee, KH Lee, KP Lee, SK Lee, TW Lee, L Liming, JT Liu, XD Liu, CH Lu, F Lu

2000

Materials Science and Engineering

79

257