作者
Junxiu Liu, Jim Harkin, Yuhua Li, Liam Maguire
发表日期
2014/1
期刊
Journal of Parallel and Distributed Computing
卷号
74
期号
1
页码范围
1984–1993
出版商
Elsevier
简介
A key requirement for modern Networks-on-Chip (NoC) is the ability to detect and diagnose faults and failures. This paper addresses the challenge of fault diagnosis using online testing where the interruption of the runtime operation (performance) under diagnosis is minimised. A novel Monitor Module (MM) is proposed to detect NoC interconnect faults which minimise the intrusion of the regular NoC traffic throughput by (1) using a channel tester which only examines NoC channels when they are idle; and (2) using a testing interval parameter based on the Binary Exponential Back off algorithm to dynamically balance the level of testing when recovering from temporary faults. The paper presents results on the minimal impact on NoC throughput for a range of testing conditions and also highlights the minimal area overhead of the MM (11.56%) compared with an adaptive NoC router implemented on FPGA hardware …
引用总数
20142015201620172018201920202021202220232024171029793231
学术搜索中的文章
J Liu, J Harkin, Y Li, L Maguire - Journal of Parallel and Distributed Computing, 2014