作者
Nahid Farhady Ghalaty, Bilgiday Yuce, Mostafa Taha, Patrick Schaumont
发表日期
2014/9/23
研讨会论文
2014 Workshop on Fault Diagnosis and Tolerance in Cryptography
页码范围
49-58
出版商
IEEE
简介
Recent research has demonstrated that there is no sharp distinction between passive attacks based on side-channel leakage and active attacks based on fault injection. Fault behavior can be processed as side-channel information, offering all the benefits of Differential Power Analysis including noise averaging and hypothesis testing by correlation. This paper introduces Differential Fault Intensity Analysis, which combines the principles of Differential Power Analysis and fault injection. We observe that most faults are biased - such as single-bit, two-bit, or three-bit errors in a byte - and that this property can reveal the secret key through a hypothesis test. Unlike Differential Fault Analysis, we do not require precise analysis of the fault propagation. Unlike Fault Sensitivity Analysis, we do not require a fault sensitivity profile for the device under attack. We demonstrate our method on an FPGA implementation of AES with a …
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NF Ghalaty, B Yuce, M Taha, P Schaumont - 2014 Workshop on Fault Diagnosis and Tolerance in …, 2014