作者
DS Akerib, S Alsum, HM Araújo, X Bai, J Balajthy, A Baxter, EP Bernard, A Bernstein, TP Biesiadzinski, EM Boulton, B Boxer, P Brás, S Burdin, D Byram, MC Carmona-Benitez, C Chan, JE Cutter, L De Viveiros, E Druszkiewicz, A Fan, S Fiorucci, RJ Gaitskell, C Ghag, MGD Gilchriese, C Gwilliam, CR Hall, SJ Haselschwardt, SA Hertel, DP Hogan, M Horn, DQ Huang, CM Ignarra, RG Jacobsen, O Jahangir, W Ji, K Kamdin, K Kazkaz, D Khaitan, EV Korolkova, S Kravitz, VA Kudryavtsev, E Leason, BG Lenardo, KT Lesko, J Liao, J Lin, A Lindote, MI Lopes, A Manalaysay, RL Mannino, N Marangou, DN McKinsey, D-M Mei, M Moongweluwan, JA Morad, A St J Murphy, A Naylor, C Nehrkorn, HN Nelson, F Neves, A Nilima, KC Oliver-Mallory, KJ Palladino, EK Pease, Q Riffard, GRC Rischbieter, C Rhyne, P Rossiter, S Shaw, TA Shutt, C Silva, M Solmaz, VN Solovov, P Sorensen, TJ Sumner, M Szydagis, DJ Taylor, R Taylor, WC Taylor, BP Tennyson, PA Terman, DR Tiedt, WH To, L Tvrznikova, U Utku, S Uvarov, A Vacheret, V Velan, RC Webb, JT White, TJ Whitis, MS Witherell, FLH Wolfs, D Woodward, J Xu, C Zhang
发表日期
2020/11/10
期刊
Physical Review D
卷号
102
期号
9
页码范围
092004
出版商
American Physical Society
简介
Dual-phase xenon detectors, as currently used in direct detection dark matter experiments, have observed elevated rates of background electron events in the low energy region. While this background negatively impacts detector performance in various ways, its origins have only been partially studied. In this paper we report a systematic investigation of the electron pathologies observed in the LUX dark matter experiment. We characterize different electron populations based on their emission intensities and their correlations with preceding energy depositions in the detector. By studying the background under different experimental conditions, we identified the leading emission mechanisms, including photoionization and the photoelectric effect induced by the xenon luminescence, delayed emission of electrons trapped under the liquid surface, capture and release of drifting electrons by impurities, and grid electron …
学术搜索中的文章
DS Akerib, S Alsum, HM Araújo, X Bai, J Balajthy… - Physical Review D, 2020