作者
Romi Satria Wahono, Nanna Suryana Herman, Sabrina Ahmad
发表日期
2014/10/1
期刊
Advanced Science Letters
卷号
20
期号
10-11
页码范围
1945-1950
出版商
American Scientific Publishers
简介
Software defects are expensive in quality and cost. The accurate prediction of defect-prone software modules can help direct test effort, reduce costs, and improve the quality of software. Machine learning classification algorithms is a popular approach for predicting software defect. Various types of classification algorithms have been applied for software defect prediction. However, no clear consensus on which algorithm perform best when individual studies are looked at separately. In this research, a comparison framework is proposed, which aims to benchmark the performance of a wide range of classification models within the field of software defect prediction. For the purpose of this study, 10 classifiers are selected and applied to build classification models and test their performance in 9 NASA MDP datasets. Area under curve (AUC) is employed as an accuracy indicator in our framework to evaluate the …
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