作者
Christian Dubuc, Jacques Beauvais, Dominique Drouin
发表日期
2008/1/14
期刊
IEEE transactions on nanotechnology
卷号
7
期号
1
页码范围
68-73
出版商
IEEE
简介
A process design based on a nanowire structure is demonstrated with the fabrication of metallic single-electron transistors. The method is capable of subattofarad resolution resulting in transistors that exhibited Coulomb blockade up to approximately 430 K. An analysis showed that these devices have sufficient operational margin to sustain process fluctuations and still operate within the temperature limits of conventional silicon field effect transistors.
引用总数
20082009201020112012201320142015201620172018201920202021202220232024157101187754148421
学术搜索中的文章