作者
Gunel Jahangirova, Paolo Tonella
发表日期
2020/10/24
研讨会论文
2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST)
页码范围
74-84
出版商
IEEE
简介
Deep Learning (DL) is increasingly adopted to solve complex tasks such as image recognition or autonomous driving. Companies are considering the inclusion of DL components in production systems, but one of their main concerns is how to assess the quality of such systems. Mutation testing is a technique to inject artificial faults into a system, under the assumption that the capability to expose (kilt) such artificial faults translates into the capability to expose also real faults. Researchers have proposed approaches and tools (e.g., Deep-Mutation and MuNN) that make mutation testing applicable to deep learning systems. However, existing definitions of mutation killing, based on accuracy drop, do not take into account the stochastic nature of the training process (accuracy may drop even when re-training the un-mutated system). Moreover, the same mutation operator might be effective or might be trivial/impossible to …
引用总数
2020202120222023202441610238
学术搜索中的文章
G Jahangirova, P Tonella - 2020 IEEE 13th International Conference on Software …, 2020