作者
PSK Prasad
发表日期
1974/6/1
期刊
Microelectronics Reliability
卷号
13
期号
3
页码范围
195-202
出版商
Pergamon
简介
In the electronics field, reliability prediction techniques have been developed to almost a fine art. Admittedly, predictions by themselves do not improve the reliability of a device. But predictions are found useful at the time of bidding for contracts and also during the reliability programmes for control and direction of the reliability growth.
学术搜索中的文章
PSK Prasad - Microelectronics Reliability, 1974