作者
Wang Gang, Li Wei, Li Ping, Li Zuxiong, Fan Xue, Jiang Jing
发表日期
2012/7/27
期刊
Journal of Semiconductors
卷号
33
期号
8
页码范围
084002-4
出版商
Journal of Semiconductors
简介
A novel antifuse structure with amorphous bismuth zinc niobate (a-BZN) dielectrics was proposed. The characteristics of the a-BZN antifuse were investigated. Programming direction of up to down was chosen to rupture the a-BZN antifuse. The breakdown voltage of the a-BZN antifuse was obtained at a magnitude of 6.56 V. A large off-state resistance of more than 1 GΩ for the a-BZN antifuse was demonstrated. The surface micrograph of the ruptured a-BZN antifuses was illustrated. Programming characteristics with the programming time of 0.46 ms and on-state properties with the average resistance value of 26.1 Ω of the a-BZN antifuse were exhibited. The difference of characteristics of the a-BZN antifuse from that of a cubic pyrochlore bismuth zinc niobate (cp-BZN) antifuse and gate oxide antifuse was compared and analyzed.
English Abstract
学术搜索中的文章
W Gang, L Wei, L Ping, L Zuxiong, F Xue, J Jing - Journal of Semiconductors, 2012