发明者
Guillermo J Tearney, Milen Shishkov, Brett Eugene Bouma, Benjamin J Vakoc
发表日期
2009/5/26
专利局
US
专利号
7538859
专利申请号
11670058
简介
In one exemplary embodiment of the present invention, method and system can be provided for obtaining information associated with at least one portion of a sample. For example, a temperature change can be caused in the portion of the sample. At least one first electro-magnetic radiation can be forwarded to a section near or in the portion of the sample. A deformation of the section can be identified at a plurality of depths as a function of (i) a phase of at least one second electro-magnetic radiation provided from the section, and/or (ii) a rate of change of the phase and/or an amplitude of the second electro-magnetic radiation. In another exemplary embodiment of the present invention, method and system can be provided for controlling a temperature distribution in a sample. For example, an electro-magnetic radiation can be provided to the section in the sample at a particular wavelength. The temperature …
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