作者
Anand Singh Rajawat, Pradeep Bedi, SB Goyal, Rabindra Nath Shaw, Ankush Ghosh
发表日期
2022
期刊
AI and IoT for Smart City Applications
页码范围
157-169
出版商
Springer Singapore
简介
The reliability, availability, security, and survivability analysis of any IoT (Internet-of-things) device is important because it provides all necessary information about the IoT device applications for smart city development to improve its performance of smart cities’ Industrial IoT Network Node. The in-depth knowledge about the IoT Device Applications to be analyzed from a parameters point of view is needed, which inspires the researcher to understand the IoT Device network system very profoundly in terms of Cyber-Physical System (CPS). Until now, less attention is being given to the reliability analysis of smart city-based Industrial IoT devices and Cyber-Physical Systems (CPS). The root failure causes a cyber-attack. The analysis provides the base failure causes, the information about the type of failures and estimates the various reliability parameters. Through this analysis, a better design, a better …
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