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Miniaturization of integrated circuits brings more devices (thus more functionality) on the same silicon area but also makes them more vulnerable to soft (transient) errors. Assessment and understanding of the magnitude of a microprocessor's vulnerability to soft errors in early stages of the design can steer wise, cost-effective protection decision at the hardware or software level. In recent fabrication technologies, the effect of radiation (neutrons or other particles) is significantly more severe on silicon devices and leads to increased numbers of multi-bit upsets. In this paper, we analyze the effects of multi-bit upsets in modern microprocessors, using microarchitecture level fault injection and a complete system stack. We present details about the effects of multi-bit upsets on 6 major hardware components of an ARM Cortex-A9 CPU modeled on Gem5 microarchitectural simulator, with 15 workloads across 8 fabrication …