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The necessity for photovoltaic (PV) arrays has expanded due to the rising demand for solar electrical energy. The demand for solar cells has grown as they are a key component of the PV array. Recent years have seen a rise in solar cell production as a result of this demand. The quality of a silicon panel affects its lifespan and effectiveness in the production of solar power. The picture edge-detection method is regularly employed to identify silicon solar panel flaws. On the other hand, defect identification is impacted by the panel's grid shadow. The most modern defect detection technique uses artificial neural networks, and pre-training the model requires a large number of potential samples from picture data sets. This paper offers the innovative Otsu-Canny operator method as a fault discovery strategy to address this problem. Rapid and accurate identification of microcracks enhances the effectiveness of fault …