作者
F Roccaforte, F Giannazzo, V Raineri
发表日期
2010/5/18
来源
Journal of Physics D: Applied Physics
卷号
43
期号
22
页码范围
223001
出版商
IOP Publishing
简介
Wide bandgap semiconductors promise devices with performances not achievable using silicon technology. Among them, silicon carbide (SiC) is considered the top-notch material for a new generation of power electronic devices, ensuring the improved energy efficiency required in modern society. In spite of the significant progress achieved in the last decade in the material quality, there are still several scientific open issues related to the basic transport properties at SiC interfaces and ion-doped regions that can affect the devices' performances, keeping them still far from their theoretical limits. Hence, significant efforts in fundamental research at the nanoscale have become mandatory to better understand the carrier transport phenomena, both at surfaces and interfaces. In this paper, the most recent experiences on nanoscale transport properties will be addressed, reviewing the relevant key points for the basic …
引用总数
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学术搜索中的文章
F Roccaforte, F Giannazzo, V Raineri - Journal of Physics D: Applied Physics, 2010