作者
Er-Ping Li, Xing-Chang Wei, Andreas C Cangellaris, En-Xiao Liu, Yao-Jiang Zhang, Marcello D'amore, Joungho Kim, Toshio Sudo
发表日期
2010/5/18
来源
IEEE Transactions on Electromagnetic Compatibility
卷号
52
期号
2
页码范围
248-265
出版商
IEEE
简介
The ever-increasing demands of digital computing and wireless communication have been driving the semiconductor technology to change with each passing day. Modern electronic systems integrate more complex components and devices, which results in a very complex electromagnetic (EM) field environment. EM compatibility has become one of the major issues in ICs redesign, mainly due to the lack of efficient and accurate simulation tools and expertise on noise reduction and immunity improvement. This paper reviews the state of the arts of IC, electronic package, and printed circuit board simulation and modeling technologies. It summarizes the modeling technologies for both available structures [multilayered power-ground planes and macromodeling of interconnect (INC)] and novel structures (nano-INCs and 3-D ICs based on through-silicon via technology). It also illustrates the trends of simulation and …
引用总数
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