作者
Xia Li, Wei Li, Yuqun Zhang, Lingming Zhang
发表日期
2019/7/10
图书
Proceedings of the 28th ACM SIGSOFT international symposium on software testing and analysis
页码范围
169-180
简介
Learning-based fault localization has been intensively studied recently. Prior studies have shown that traditional Learning-to-Rank techniques can help precisely diagnose fault locations using various dimensions of fault-diagnosis features, such as suspiciousness values computed by various off-the-shelf fault localization techniques. However, with the increasing dimensions of features considered by advanced fault localization techniques, it can be quite challenging for the traditional Learning-to-Rank algorithms to automatically identify effective existing/latent features. In this work, we propose DeepFL, a deep learning approach to automatically learn the most effective existing/latent features for precise fault localization. Although the approach is general, in this work, we collect various suspiciousness-value-based, fault-proneness-based and textual-similarity-based features from the fault localization, defect prediction …
引用总数
201920202021202220232024112253626330
学术搜索中的文章
X Li, W Li, Y Zhang, L Zhang - Proceedings of the 28th ACM SIGSOFT international …, 2019