Nilesh Goel

Nilesh Goel

Birla Institute of Technology and Science, Pilani Dubai Campus (BITS Pilani Dubai Campus)
在 ieee.org 的电子邮件经过验证
被引用次数：1260
Device reliability Reliability aware circuits characterization and modeling.
Anahid Sabetghadam

Anahid Sabetghadam

TU Delft
在 tudelft.nl 的电子邮件经过验证
被引用次数：1161
Membrane preparation characterization and modeling
Leonel Paredes-Madrid

Leonel Paredes-Madrid

FIMEB, Universidad Antonio Nariño
在 uan.edu.co 的电子邮件经过验证
被引用次数：411
Conductive Polymer Composites Force Sensing Resistors Characterization and Modeling Precision Agriculture
Ahmad Khusro

Ahmad Khusro

School of Engineering and Digital Sciences, Nazarbayev University, Astana, Kazakhstan
在 st.jmi.ac.in 的电子邮件经过验证
被引用次数：211
RF/Microwave Engineering Semiconductor Devices Characterization and Modeling Machine Learning &
Romeo Kom Kammeugne

Romeo Kom Kammeugne

CEA-LETI/INPG/Minatec/UGA
在 ieee.org 的电子邮件经过验证
被引用次数：46
HEMT MOSFET Microelectronic devices Power electronics and RF Characterization and Modeling