Reinhold H. Dauskardt

Reinhold H. Dauskardt

Ruth G. and William K. Bowes Professor, Stanford University
在 stanford.edu 的电子邮件经过验证
被引用次数：23212
nanomaterials thin-films device reliability human skin
KL PEY

KL PEY

Professor, Singapore University of Technology and Design
在 sutd.edu.sg 的电子邮件经过验证
被引用次数：10566
Device reliability ultrathin gate oxide breakdown
Chong Leong, Gan., Ph.D, FRSC, FInstP, FIOM3

Chong Leong, Gan., Ph.D, FRSC, FInstP, FIOM3

Micron Memory Taiwan Co Ltd
在 broadcom.com 的电子邮件经过验证
被引用次数：3844
Microelectronics Packaging Reliability Engineering Device Reliability Material Science
Ashutosh Jain

Ashutosh Jain

WesternDigital
在 wdc.com 的电子邮件经过验证
被引用次数：2737
Semiconductor Packaging Materials Science Device Reliability
Jungjin Yoon

Jungjin Yoon

Research Scientist at First Solar
被引用次数：2686
flexible electronics solar energy conversion device reliability
Abhisek Dixit

Abhisek Dixit

NXP Chair Professor, Electrical Engineering, IIT Delhi, New Delhi, India
在 ee.iitd.ac.in 的电子邮件经过验证
被引用次数：2669
Device Reliability RF Characterization Compact Modeling Cryogenic CMOS Radiation Effects
Ilgu Yun

Ilgu Yun

Professor, School of Electrical and Electronic Engineering, Yonsei University, Seoul, South …
在 yonsei.ac.kr 的电子邮件经过验证
被引用次数：2482
Semiconductor Device Modeling Semiconductor Process Control Device Reliability TCAD Photodiodes
Cheng Liu

Cheng Liu

The Hong Kong University of Science and Technology
在 ust.hk 的电子邮件经过验证
被引用次数：2087
III-nitride semiconductors GaN power devices device reliability novel device structures
Nilesh Goel

Nilesh Goel

Birla Institute of Technology and Science, Pilani Dubai Campus (BITS Pilani Dubai Campus)
在 ieee.org 的电子邮件经过验证
被引用次数：1254
Device reliability Reliability aware circuits characterization and modeling.
Young Gon Lee

Young Gon Lee

SK hynix
在 sk.com 的电子邮件经过验证
被引用次数：1061
Device reliability Electrical measurement Semiconductor device
1 - 10