Charlie Kong

Charlie Kong

Senior Research Officer, University of New South Wales
在 unsw.edu.au 的电子邮件经过验证
被引用次数：6477
Materials Science Electron Microscopy Focused Ion Beam
Ian MacLaren

Ian MacLaren

University of Glasgow, School of Physics and Astronomy
在 glasgow.ac.uk 的电子邮件经过验证
被引用次数：5222
Electron Microscopy Nanostructure Electron Energy Loss Spectroscopy Direct Electron Detectors Focused Ion Beam
Yuval Greenzweig

Yuval Greenzweig

None
被引用次数：4725
planetary science Semiconductor technology circuit edit focused ion beam
Christian Boit

Christian Boit

Professor für Halbleiterbauelemente, TU Berlin
在 tu-berlin.de 的电子邮件经过验证
被引用次数：4135
optical interactions of electronic devices focused ion beam
Philip Moll

Philip Moll

Max-Planck-Institute for the Structure and Dynamics of Matter, Hamburg, Germany
在 mpsd.mpg.de 的电子邮件经过验证
被引用次数：4112
Topological semi-metals Superconductivity correlated electrons Focused Ion Beam
David C Cox

David C Cox

Principal Research Fellow, University of Surrey
在 surrey.ac.uk 的电子邮件经过验证
被引用次数：4109
Focused ion beam Nanofabrication
Braulio Archanjo

Braulio Archanjo

National Institute of Metrology, Quality and Technology of Brazil
在 inmetro.gov.br 的电子邮件经过验证
被引用次数：4097
Nanometrology Electron Microscopy Atomic Force Microscopy Nanofabrication Focused Ion Beam
Lifei Xi

Lifei Xi

FACTS@Nanyang Technological University
在 ntu.edu.sg 的电子邮件经过验证
被引用次数：3818
Catalyst Nanoparticle-plant interaction Novel Materials Focused Ion Beam TEM
Markus Becherer

Markus Becherer

Technische Universtität München, TUM
在 tum.de 的电子邮件经过验证
被引用次数：3278
semiconductors chip-based sensors micormagnetics novel fabrication technology focused-ion-beam
Emmanuelle Boehm-Courjault

Emmanuelle Boehm-Courjault

EPFL-Laboratory for Construction Materials
在 epfl.ch 的电子邮件经过验证
被引用次数：2236
Concrete chemistry cementitious materials scanning electron microscopy transmission electron microscopy focused ion beam
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