Eduard A Cartier

Eduard A Cartier

IBM Research, TJ Watson Research Center
在 us.ibm.com 的电子邮件经过验证
被引用次数：19746
CMOS gate oxides reliability ferroelectrics RRAM
Jayanti Paul

Jayanti Paul

Research Scholar
被引用次数：21
Ge MOSFET GeSn GaN HEMT FinFETs Gate Oxides