Eunha Lee

Eunha Lee

SAIT (Samsung Advanced Institute of Technology), Samsung Electronics
在 samsung.com 的电子邮件经过验证
被引用次数：10308
Microscopy & spectroscopy electron tomography 2D material high-k dielectric oxide TFT
Ning Fang

Ning Fang

Xiamen University
被引用次数：4686
Analytical/Physical Chemistry Microscopy & Spectroscopy Biophysics Single Molecule Catalysis
Zheng Ren

Zheng Ren

Intel Corporation, University of Connecticut
在 uconn.edu 的电子邮件经过验证
被引用次数：3327
Materials Engineering Nanotechnology Microscopy & Spectroscopy Surface Science
Peng Zhang

Peng Zhang

King Abdullah University of Science and Technology
在 kaust.edu.sa 的电子邮件经过验证
被引用次数：888
Analytical Chemistry and Instruments Microscopy & Spectroscopy Nanofabrication Surface Force Apparatus
Mostak Ahmed

Mostak Ahmed

Device Processing Engineer
在 unsw.edu.au 的电子邮件经过验证
被引用次数：308
Nano/Microfabrication Biosensing & Molecular Biology Electrochemical Methods Microscopy & Spectroscopy
Amrit Laudari

Amrit Laudari

University of North Dakota
在 und.edu 的电子邮件经过验证
被引用次数：265
Condensed matter Physics Ultra High Vacuum Microscopy & Spectroscopy Materials Science Organic Electronics
Sameera Pathiranage

Sameera Pathiranage

North Carolina State University
在 ncsu.edu 的电子邮件经过验证
被引用次数：88
Condensed matter Physics Surfaces and Interfaces Ultra High Vacuum Microscopy & Spectroscopy