Abhisek Dixit

Abhisek Dixit

NXP Chair Professor, Electrical Engineering, IIT Delhi, New Delhi, India
在 ee.iitd.ac.in 的电子邮件经过验证
被引用次数：2677
Device Reliability RF Characterization Compact Modeling Cryogenic CMOS Radiation Effects
Abhishek Vaidya

Abhishek Vaidya

Data Scientist, Intel Technology Development | Ph.D., University at Buffalo
在 buffalo.edu 的电子邮件经过验证
被引用次数：480
Widebandgap semicondcutors device scaling RF characterization
Daniel Bafia

Daniel Bafia

Associate Scientist, Fermilab
在 fnal.gov 的电子邮件经过验证
被引用次数：201
Superconducting RF Materials RF Characterization
Talha Chohan

Talha Chohan

NaMLab gGmbH
在 namlab.com 的电子邮件经过验证
被引用次数：137
Semiconductor Devices Reliability RF Characterization
Yasmina Atrouche-Belaroussi

Yasmina Atrouche-Belaroussi

Maître de Recherche A, Centre de Développement des Technologies Avancées (CDTA)
在 cdta.dz 的电子邮件经过验证
被引用次数：107
Microelectronics and Nanotechnology RF characterization millimeter wave Physical characterization
Jagori Raychaudhuri

Jagori Raychaudhuri

Department of Physics, IIT Delhi
在 physics.iitd.ac.in 的电子邮件经过验证
被引用次数：17
GaN HEMT RF characterization
Shivansh Awasthi

Shivansh Awasthi

PhD research scholar, CARE IIT DELHI and ICST NYCU Taiwan
在 iitd.ac.in 的电子邮件经过验证
被引用次数：7
GaN HEMT Modeling and TCAD simulation Device Reliability Compact Modeling RF characterization
Alvin Yong Shee Meng

Alvin Yong Shee Meng

在 student.usm.my 的电子邮件经过验证
被引用次数：6
Semiconductor Fabrication III-nitride research ScN research RF Characterization Microwave Engineering