Kazutoshi Kobayashi

Kazutoshi Kobayashi

Professor, Kyoto Institute of Technology
在 kit.ac.jp 的电子邮件经过验证
被引用次数：3369
CMOS Soft errors BTI RTN variations
Mojtaba Ebrahimi

Mojtaba Ebrahimi

Functional Safety Engineer, Robert Bosch GmbH
在 bosch.com 的电子邮件经过验证
被引用次数：1989
Functional Safety Soft Errors Transistor Aging NVM
Daisuke Kobayashi

Daisuke Kobayashi

ISAS/JAXA
在 isas.jaxa.jp 的电子邮件经过验证
被引用次数：1429
Radiation Effects Space Electronics Soft Errors
Srikanth Jagannathan

Srikanth Jagannathan

NXP Semiconductors
在 nxp.com 的电子邮件经过验证
被引用次数：1407
AMS verification soft errors radiation effects RF design circuit and device reliability
Steven Walstra

Steven Walstra

Intel Corporation; University of Florida
在 intel.com 的电子邮件经过验证
被引用次数：1108
Circuit-Level Reliabilty Soft Errors Compact Resistance and Capacitance …
Li Yuanqing

Li Yuanqing

Infinera Canada Inc., IHP, University of Saskatchewan
在 infinera.com 的电子邮件经过验证
被引用次数：539
ASIC design soft errors radiation effects DSP
Jens Vankeirsbilck

Jens Vankeirsbilck

Postdoc, KU Leuven
在 kuleuven.be 的电子邮件经过验证
被引用次数：405
Soft Errors Software-implemented Fault Tolerance Fault Injection Software Updates
Selahattin Sayil

Selahattin Sayil

Professor of Electrical Engineering, Lamar University, Beaumont, TX USA
在 lamar.edu 的电子邮件经过验证
被引用次数：395
soft errors interconnect modeling radiation mitigation contactless testing low power design
Tanima Dey

Tanima Dey

Software Engineer, Intel Corporation
在 intel.com 的电子邮件经过验证
被引用次数：306
Resource Contention Computer Architecture Performance Analysis Soft Errors Run-time Systems
Fritz Gerald Previlon

Fritz Gerald Previlon

Arm, Inc
在 husky.neu.edu 的电子邮件经过验证
被引用次数：269
Soft Errors System Reliability Computer Architecture
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