Effort-aware just-in-time defect prediction: simple unsupervised models could be better than supervised models Y Yang, Y Zhou, J Liu, Y Zhao, H Lu, L Xu, B Xu, H Leung Proceedings of the 2016 24th ACM SIGSOFT international symposium on …, 2016 | 268 | 2016 |
How far we have progressed in the journey? an examination of cross-project defect prediction Y Zhou, Y Yang, H Lu, L Chen, Y Li, Y Zhao, J Qian, B Xu ACM Transactions on Software Engineering and Methodology (TOSEM) 27 (1), 1-51, 2018 | 190 | 2018 |
Are Slice-Based Cohesion Metrics Actually Useful in Effort-Aware Post-Release Fault-Proneness Prediction? An Empirical Study Y Yang, Y Zhou, H Lu, L Chen, Z Chen, B Xu, H Leung, Z Zhang IEEE Transactions on Software Engineering 41 (4), 331-357, 2015 | 79 | 2015 |
Code churn: A neglected metric in effort-aware just-in-time defect prediction J Liu, Y Zhou, Y Yang, H Lu, B Xu 2017 ACM/IEEE International Symposium on Empirical Software Engineering and …, 2017 | 70 | 2017 |
Empirical analysis of network measures for effort-aware fault-proneness prediction W Ma, L Chen, Y Yang, Y Zhou, B Xu Information and Software Technology 69, 50-70, 2016 | 68 | 2016 |
An empirical study on dependence clusters for effort-aware fault-proneness prediction Y Yang, M Harman, J Krinke, S Islam, D Binkley, Y Zhou, B Xu Proceedings of the 31st IEEE/ACM International Conference on Automated …, 2016 | 40 | 2016 |
Predicting vulnerable components via text mining or software metrics? An effort-aware perspective Y Tang, F Zhao, Y Yang, H Lu, Y Zhou, B Xu 2015 IEEE International Conference on Software Quality, Reliability and …, 2015 | 39 | 2015 |
Source code size estimation approaches for object-oriented systems from UML class diagrams: A comparative study Y Zhou, Y Yang, B Xu, H Leung, X Zhou Information and Software Technology 56 (2), 220-237, 2014 | 35 | 2014 |
Hunting for bugs in code coverage tools via randomized differential testing Y Yang, Y Zhou, H Sun, Z Su, Z Zuo, L Xu, B Xu Proceedings of the 41st International Conference on Software Engineering …, 2019 | 34 | 2019 |
An empirical analysis of package-modularization metrics: Implications for software fault-proneness Y Zhao, Y Yang, H Lu, Y Zhou, Q Song, B Xu Information and Software Technology 57, 186-203, 2015 | 28 | 2015 |
Towards an understanding of change types in bug fixing code Y Zhao, H Leung, Y Yang, Y Zhou, B Xu Information and software technology 86, 37-53, 2017 | 27 | 2017 |
Understanding the value of considering client usage context in package cohesion for fault-proneness prediction Y Zhao, Y Yang, H Lu, J Liu, H Leung, Y Wu, Y Zhou, B Xu Automated Software Engineering 24, 393-453, 2017 | 26 | 2017 |
The influence of developer quality on software fault-proneness prediction Y Wu, Y Yang, Y Zhao, H Lu, Y Zhou, B Xu 2014 eighth international conference on software security and reliability …, 2014 | 22 | 2014 |
Is learning-to-rank cost-effective in recommending relevant files for bug localization? F Zhao, Y Tang, Y Yang, H Lu, Y Zhou, B Xu 2015 IEEE International Conference on Software Quality, Reliability and …, 2015 | 17 | 2015 |
CBUA: A probabilistic, predictive, and practical approach for evaluating test suite effectiveness P Zhang, Y Li, W Ma, Y Yang, L Chen, H Lu, Y Zhou, B Xu IEEE Transactions on Software Engineering 48 (3), 1067-1096, 2020 | 13 | 2020 |
Automatic Self-Validation for Code Coverage Profilers Y Yang, Y Jiang, Z Zuo, Y Wang, H Sun, H Lu, Y Zhou, B Xu Proceedings of the 34th International Conference on Automated Software …, 2019 | 11 | 2019 |
SMT solver validation empowered by large pre-trained language models M Sun, Y Yang, Y Wang, M Wen, H Jia, Y Zhou 2023 38th IEEE/ACM International Conference on Automated Software …, 2023 | 10 | 2023 |
Predictive analysis for race detection in software-defined networks G Lu, L Xu, Y Yang, B Xu Science China Information Sciences 62, 1-20, 2019 | 9 | 2019 |
Exploring the impact of code smells on fine-grained structural change-proneness H Liu, B Li, Y Yang, W Ma, R Jia International Journal of Software Engineering and Knowledge Engineering 28 …, 2018 | 8 | 2018 |
An ast-based approach to classifying defects C Liu, Y Zhao, Y Yang, H Lu, Y Zhou, B Xu 2015 IEEE International Conference on Software Quality, Reliability and …, 2015 | 7 | 2015 |