Component Interaction Graph: A new approach to test component composition AA Acharya, SK Jena arXiv preprint arXiv:1006.2812, 2010 | 9 | 2010 |
Maximizing yield through retesting of rejected circuits using approximation technique SK Jena, S Biswas, JK Deka 2020 IEEE REGION 10 CONFERENCE (TENCON), 182-187, 2020 | 8 | 2020 |
Retesting defective circuits to allow acceptable faults for yield enhancement SK Jena, S Biswas, JK Deka Journal of Electronic Testing 37 (5), 633-652, 2021 | 4 | 2021 |
Systematic design of approximate adder using significance based gate-level pruning (SGLP) for image processing application SK Jena, S Biswas, JK Deka Pattern Recognition and Machine Intelligence: 8th International Conference …, 2019 | 4 | 2019 |
Approximate testing of digital VLSI circuits using error significance based fault analysis SK Jena, S Biswas, JK Deka 2020 24th International Symposium on VLSI Design and Test (VDAT), 1-6, 2020 | 3 | 2020 |
Approximate function memoization P Arundhati, SK Jena, SK Pani Concurrency and Computation: Practice and Experience 34 (23), e7204, 2022 | 1 | 2022 |
Fault Classification Based Approximate Testing of Digital VLSI Circuit SK Jena Electronic Systems and Intelligent Computing: Proceedings of ESIC 2020, 641-651, 2020 | 1 | 2020 |
A robust approach for digital watermarking of satellite imagery dataset A Husain, AD Mishra, SK Jena International Journal of Swarm Intelligence 7 (1), 82-93, 2022 | | 2022 |
C Programming: Learn to Code SK Jena Chapman and Hall/CRC, 2021 | | 2021 |
Analysis and Redesign of Digital Circuits to Support Green Computing Through Approximation SK Jena, SK Srivastava, A Husain Proceedings of the International Conference on Paradigms of Computing …, 2021 | | 2021 |
Component Interaction Graph: A new approach to test component composition A Abhinna Acharya, SK Jena arXiv e-prints, arXiv: 1006.2812, 2010 | | 2010 |
Design and Testing of Digital VLSI Circuits using Approximate Computing SK Jena Guwahati, 0 | | |